Download PDF The Design of CMOS Radio-Frequency Integrated Circuits, Second Edition By Thomas H. Lee
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The Design of CMOS Radio-Frequency Integrated Circuits, Second Edition By Thomas H. Lee
Download PDF The Design of CMOS Radio-Frequency Integrated Circuits, Second Edition By Thomas H. Lee
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- Sales Rank: #330757 in Books
- Brand: Cambridge University Press
- Published on: 2003-12-22
- Ingredients: Example Ingredients
- Original language: English
- Number of items: 1
- Dimensions: 9.96" h x 1.69" w x 6.97" l, 3.42 pounds
- Binding: Hardcover
- 816 pages
- Used Book in Good Condition
Review
"Tom Lee has written a terrific book. Everyone that visits my office wants to borrow it, and I tell them to go buy their own."
David Rutledge, California Institute of Technology
"[A] useful reference both for students in advanced courses and for engineers in the field."
Dejan S. Vujic, Communications Engineer
"Tom Lee's love of, and deep involvement in, radio-frequency integrated circuits is immediately obvious upon glancing through this excellent and original book. Some of his viewpoints are controversial; but this, in fact, makes this stimulating, hard-to-put-down book all the more interesting."
Yannis Tsividis, Columbia University
“Thomas Lee uses [an] engaging history lesson as a starting point for this 797-page guide to the design of gigahertz RF ICs. In the second edition, Lee has tweaked all of the first-edition material and added additional information...The author's conversational writing style interspersed with lighthearted humor is enjoyable to read.”
Electronic Design
"...The first edition of this book, published in 1998, was a pioneering textbook on the field of RF CMOS design. This second edition is a very interesting and upgraded version that includes new material and revised topics...This second edition, which is upgraded and improved, is really useful, both in the industry and academia, for the new generation of RF engineers...and is a valuable reference for practicing engineers..."
IEEE Circuits and Devices Magazine
About the Author
Lee-Stanford University
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